期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
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2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2003, vol.19, no.1 2003, vol.19, no.2 2003, vol.19, no.3 2003, vol.19, no.4 2003, vol.19, no.5 2003, vol.19, no.6

题名作者出版年年卷期
Primitive Polynomials Over GF(2) of Degree up to 660 with Uniformly Distributed CoefficientsJANUSZ RAJSKI; JERZY TYSZER; K. K. Saluja20032003, vol.19, no.6
A Low Power Pseudo-Random BIST TechniqueNADIR Z. BASTURKMEN; SUDHAKAR M. REDDY; IRITH POMERANZ; M. Abramovici20032003, vol.19, no.6
On Faster I{Sub}(DDQ) MeasurementsC. THIBEAULT; R. Makki20032003, vol.19, no.6
Defect Diagnosis Using a Current Ratio Based Quiescent Signal Analysis Model for Commercial Power GridsChintan Patel; Ernesto Staroswiecki; Smita Pa War; Dhruva Acharyya; Jim Plusquellic; Editor: R. Makki20032003, vol.19, no.6
A BICS for CMOS OpAmps by Monitoring the Supply Current PeakJ. Font; J. Ginard; R. Picos; E. Isern; J. Segura; M. Roca And E. Garcia20032003, vol.19, no.5
A Statistical Sampler for a New On-Line Analog Test MethodMarcelo Negreiros; Luigi Carro; Altamiro A. Susin20032003, vol.19, no.5
Accurate Analysis of Single Event Upsets in a Pipelined MicroprocessorM. Rebaudengo; M. Sonza Reorda; M. Violante20032003, vol.19, no.5
Multi-Level Fault Injections in VHDL Descriptions: Alternative Approaches and ExperimentsR. Leveugle; K. Hadjiat20032003, vol.19, no.5
BIST-Based Delay-Fault Testing in FPGAsMiron Abramovici; Charles E. Stroud20032003, vol.19, no.5
On-Line Monitor Design of Finite-State MachinesFeng Gao; John P. Hayes20032003, vol.19, no.5
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