期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2003, vol.19, no.1 2003, vol.19, no.2 2003, vol.19, no.3 2003, vol.19, no.4 2003, vol.19, no.5 2003, vol.19, no.6

题名作者出版年年卷期
The ∑Δ-BIST method applied to analog filtersL. Cassol; O. Betat; L. Carro; M. Lubaszewski20032003, vol.19, no.1
Innovative built-in self-test schemes for on-chip diagnosis, compliant with the IEEE 1149.4 mixed-signal test bus standardGladys Omayra Ducoudray-Acevedo; Jamie Ramirez-Angulo20032003, vol.19, no.1
Topological considerations for the diagnosability conditions of analogue circuits using a pair of conjugate treesLuis Hernandez-Martinez; Arturo Sarmiento-Reyes20032003, vol.19, no.1
Multiple scan chain design for two-pattern testingIlia Polian; Bernd Becker20032003, vol.19, no.1
A unified DFT approach for BIST and external testM. -L. Flottes; C. Landrault; A. Petitqueux20032003, vol.19, no.1
A new on-line robust approach to design noise-immune speech recognition systemsFabian Vargas; Rubem D. R. Fagundes; Daniel Barros, Jr.20032003, vol.19, no.1
Design error diagnosis with re-synthesis in combinational circuitsRaimund Ubar20032003, vol.19, no.1
Assessing the soft error rate of digital architectures devoted to operate in radiation environment: a case studiedR. Velazco; S. Rezgui; H. Ziade20032003, vol.19, no.1



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