期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2003, vol.19, no.1 2003, vol.19, no.2 2003, vol.19, no.3 2003, vol.19, no.4 2003, vol.19, no.5 2003, vol.19, no.6

题名作者出版年年卷期
Instruction-based self-testing of processor coresNektarios Kranitis; Antonis Paschalis; Dimitris Gizopoulos; Yervant Zorian20032003, vol.19, no.2
LI-BIST: a low-cost self-test scheme for SoC logic cores and interconnectsKrishna Sekar; Sujit Dey20032003, vol.19, no.2
Modern test techniques: tradeoffs, synergies, and scalable benefitsErik H. Volkerink; Ajay Khoche; Jochen Rivoir; Klaus D. Hilliges20032003, vol.19, no.2
Performance comparison of VLV, ULV, and ECR testsWanli Jiang; Eric Peterson20032003, vol.19, no.2
A hierarchical test generation approach using program slicing techniques on hardware description languagesVivekananda M. Vedula; Jacob A. Abraham; Jayanta Bhadra; Raghuram Tupuri20032003, vol.19, no.2
A symbolic inject-and-evaluate paradigm for Byzantine fault diagnosisShi-Yu Huang20032003, vol.19, no.2
Statistical tolerance analysis for assured analog test coverageSule Ozev; Alex Orailoglu20032003, vol.19, no.2
Timing Jitter Measurement of intrinsic random jitter and sinusoidal jitter using frequency divisionTakahiro J. Yamaguchi; Masahiro Ishida; Mani Soma; Louis Malarsie; Hirobumi Musha20032003, vol.19, no.2
Dynamic faults in random-access-memories: concept, fault models and testsSaid Hamdioui; Zaid Al-Ars; A. D. J. Van de Goor; Mike Rodgers20032003, vol.19, no.2
Testing and diagnosis methodologies for embedded content addressable memoriesJin-Fu Li; Ruey-Shing Tzeng; Cheng-Wen Wu20032003, vol.19, no.2



制造业外文文献服务平台