期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2003, vol.19, no.1 2003, vol.19, no.2 2003, vol.19, no.3 2003, vol.19, no.4 2003, vol.19, no.5 2003, vol.19, no.6

题名作者出版年年卷期
A ring architecture strategy for BIST test pattern generationC. Fagot; O. Gascuel; P. Girard; C. Landrault20032003, vol.19, no.3
LFSR characteristic polynomials for pseudo-exhaustive TPG with low number of seedsDimitri Kagaris; Spyros Tragoudas20032003, vol.19, no.3
Built-in test with modified-booth high-speed pipelined multipliers and dividersHao-Yung Lo; Hsiu-Feng Lin; Chichyang Chen; Jenshiuh Liu; Chia-Cheng Liu20032003, vol.19, no.3
Modeling fault coverage of random test patternsHailong Cui; Sharad C. Seth; Shashank K. Mehta20032003, vol.19, no.3
Easily testable cellular carry Lookahead addersDimitris Gizopoulos; Mihaslis Psarakis; Antonis Paschalis; Yervant Zorian20032003, vol.19, no.3
A DFT technique for testing high-speed circuits with arbitrarily slow testersMuhammad Nummer; Manoj Sachdev20032003, vol.19, no.3
A novel built-in self-repair approach for embedded RAMsShyue-Kung Lu20032003, vol.19, no.3
Replacing I{sub}(DDQ) testing: with variance reductionC. Thibeault20032003, vol.19, no.3
Leakage current in sub-quarter micron MOSFET: a perspective on stressed delta I{sub}(DDQ) testingOleg Semenov; Arman Vassighi; Manoj Sachdev20032003, vol.19, no.3
Thermal testing of analogue integrated circuits: a case studyJ. Altet; A. Ivanov; A. Wong20032003, vol.19, no.3



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