期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2003, vol.19, no.1 2003, vol.19, no.2 2003, vol.19, no.3 2003, vol.19, no.4 2003, vol.19, no.5 2003, vol.19, no.6

题名作者出版年年卷期
On a statistical fault diagnosis approach enabling fast yield ramp-upCamelia Hora; Rene Segers; Stefan Eichenberger; Maurice Lousberg20032003, vol.19, no.4
Modeling the random parameters effects in a non-split model of gate oxide shortM. Renovell; J. M. Galliere; F. Azais; Y. Bertrand20032003, vol.19, no.4
Simulating realistic bridging and crosstalk faults in an industrial settingJonathan Bradford; Hartmut Delong; Ilia Polian; Bernd Becker20032003, vol.19, no.4
Synchronous full-scan for asynchronous handshake circuitsFrank Te Beest; Ad Peeters; Kees Van Berkel; Hans Kerkhoff20032003, vol.19, no.4
Data invalidation analysis for scan-based debug on multiple-clock system chipsSandeep Kumar Goel; Bart Vermeulen20032003, vol.19, no.4
Multi-TAP controller architecture for digital system chipsBart Vermeulen; Tom Waayers; Sjaak Bakker20032003, vol.19, no.4
A test time reduction algorithm for test architecture design for core-based system chipsSandeep Kumar Goel; Erik Jan Marinissen20032003, vol.19, no.4
Efficient transition fault ATPG algorithms based on stuck-at test vectorsXiao Liu; Michael S. Hsiao; Sreejit Chakravarty; Paul J. Thadikaran20032003, vol.19, no.4
On selecting testable paths in scan designsYun Shao; Sudhakar M. Reddy; Irith Pomeranz; Seiji Kajihara20032003, vol.19, no.4
Reducing average and peak test power through scan chain modificationOzgur Sinanoglu; Ismet Bayraktaroglu; Alex Orailoglu20032003, vol.19, no.4
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