期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



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2024

2006, vol.22, no.1 2006, vol.22, no.2 2006, vol.22, no.3 2006, vol.22, no.4-6

题名作者出版年年卷期
Lifetime Prediction and Design-for-Reliability of IC Interconnections with Electromigration Induced Degradation in the Presence of Manufacturing DefectsXIANGDONG XUAN; ABHIJIT CHATTERJEE; ADIT D. SINGH20062006, vol.22, no.4-6
Embedded System Level Self-Test for Mixed-Signal IO VerificationV. LOUKUSA20062006, vol.22, no.4-6
Built-In-Self-Testing Techniques for Programmable Capacitor ArraysAMIT LAKNAUR; SAI RAGHURAM DURBHA; HAIBO WANG20062006, vol.22, no.4-6
A 1-MHz Area-Efficient On-Chip Spectrum Analyzer for Analog TestingM. A. DOMINGUEZ; J. L. AUSIN; J. F. DUQUE-CARRILLO20062006, vol.22, no.4-6
TBSA: Threshold-Based Simulation Accuracy Method for Fast Analog DC Fault SimulationMICHEL MORNEAU; ABDELHAKIM KHOUAS20062006, vol.22, no.4-6
Proposal of Fault Diagnosis of Analog Circuits by Combining Operation-Region Model and X-Y Zoning Method: Case StudyYUKIYA MIURA20062006, vol.22, no.4-6
Structural Fault Modeling and Fault Detection Through Neyman-Pearson Decision Criteria for Analog Integrated CircuitsAMIR ZJAJO; JOSE PINEDA DE GYVEZ; GUIDO GRONTHOUD20062006, vol.22, no.4-6
On-Chip Random Jitter Testing Using Low Tap-Count Coarse Delay LinesJIUN-LANG HUANG20062006, vol.22, no.4-6
Towards Fault-Tolerant RF Front EndsTEJASVI DAS; ANAND GOPALAN; CLYDE WASHBURN; P. R. MUKUND20062006, vol.22, no.4-6
Investigation into the Use of Hybrid Solutions for ΣΔ A/D Converter TestingK. GEORGOPOULOS; A. LECHNER; M. BURBIDGE; A. RICHARDSON20062006, vol.22, no.4-6
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