期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

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2006 2007 2008 2009 2010 2011
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2018 2019 2020 2021 2022 2023
2024

2006, vol.22, no.1 2006, vol.22, no.2 2006, vol.22, no.3 2006, vol.22, no.4-6

题名作者出版年年卷期
Scaling of i{sub}(DDT) Test Methods for Random Logic CircuitsALI CHEHAB; SAURABH PATEL; RAFIC MAKKI20062006, vol.22, no.1
Theorems for Fault Collapsing in Combinational CircuitsAUDHILD VAAJE20062006, vol.22, no.1
An Efficient Dictionary Organization for Maximum DiagnosisSUNGHOON CHUN; SANGWOOK KIM; HONG-SIK KIM; SUNGHO KANG20062006, vol.22, no.1
Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic System AssemblyZHEN SHI; PETER SANDBORN20062006, vol.22, no.1
Automatic Test Pattern Generation for Resistive Bridging FaultsPIET ENGELKE; ILIA POLIAN; MICHEL RENOVELL; BERND BECKER20062006, vol.22, no.1
A Self Test Program Design Technique for Embedded DSP CoresHANI RIZK; CHRIS PAPACHRISTOU; FRANCIS WOLFF20062006, vol.22, no.1
A Gated Clock Scheme for Low Power Testing of Logic CoresYANNICK BONHOMME; PATRICK GIRARD; LOIS GUILLER; CHRISTIAN LANDRAULT; SERGE PRAVOSSOUDOVITCH; ARNAUD VIRAZEL20062006, vol.22, no.1
Modulo p = 3 Checking for a Carry Select AdderV. OCHERETNIJ; M. GOSSEL; E. S. SOGOMONYAN; D. MARIENFELD20062006, vol.22, no.1



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