期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2006, vol.22, no.1 2006, vol.22, no.2 2006, vol.22, no.3 2006, vol.22, no.4-6

题名作者出版年年卷期
Impact of Body Bias on Delay Fault Testing of Sub-100 nm CMOS CircuitsBIPUL C. PAUL; KAUSHIK ROY20062006, vol.22, no.2
Implementing Symmetric Functions with Hierarchical Modules for Stuck-at and Path-Delay Fault TestabilityHAFIZUR RAHAMAN; DEBESH K. DAS; BHARGAB B. BHATTACHARYA20062006, vol.22, no.2
Concurrent Error Detection in a Polynomial Basis Multiplier over GF(2{sup}m)CHIOU-YNG LEE; CHE WUN CHIOU; JIM-MIN LIN20062006, vol.22, no.2
Accurate Whole-Chip Diagnostic Strategy for Scan Designs with Multiple FaultsYU-CHIUN LIN; SHI-YU HUANG20062006, vol.22, no.2
An Efficient BIST Architecture for Delay Faults in the Logic Cells of Symmetrical SRAM-Based FPGAsPATRICK GIRARD; OLIVIER HERON; SERGE PRAVOSSOUDOVITCH; MICHEL RENOVELL20062006, vol.22, no.2
Crosstalk Induced Fault Analysis and Test in DRAMsZEMO YANG; SAMIHA MOURAD20062006, vol.22, no.2
Electro-thermal Stimuli for MEMS Testing in FSBM TechnologyN. DUMAS; F. AZAIS; L. LATORRE; P. NOUET20062006, vol.22, no.2
Test Planning and Test Resource Optimization for Droplet-Based Microfluidic SystemsFEI SU; SULE OZEV; KRISHNENDU CHAKRABARTY20062006, vol.22, no.2



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