期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

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2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2006, vol.22, no.1 2006, vol.22, no.2 2006, vol.22, no.3 2006, vol.22, no.4-6

题名作者出版年年卷期
A Low-Cost Jitter Measurement Technique for BIST ApplicationsJIUN-LANG HUANG; JUI-JER HUANG; YUAN-SHUANG LIU20062006, vol.22, no.3
A Novel RF Test Scheme Based on a DFT MethodJEE-YOUL RYU; BRUCE C. KIM; IBOUN SYLLA20062006, vol.22, no.3
An Automated BIST Architecture for Testing and Diagnosing FPGA Interconnect FaultsJACK SMITH; TIAN XIA; CHARLES STROUD20062006, vol.22, no.3
Defect Simulation Methodology for I{sub}(DDT) TestingABHISHEK SINGH; JIM PLUSQUELLIC; DHANANJAY PHATAK; CHINTAN PATEL20062006, vol.22, no.3
Observability Statement Coverage Based on Dynamic Factored Use-Definition Chains for Functional VerificationTAO LV; JIAN-PING FAN; XIAO-WEI LI; LING-YI LIU20062006, vol.22, no.3
ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March SolutionsLUIGI DILILLO; PATRICK GIRARD; SERGE PRAVOSSOUDOVITCH; ARNAUD VIRAZEL; SIMONE BORRI; MAGALI HAGE-HASSAN20062006, vol.22, no.3
Combining Scan Test and Built-in Self TestMARKUS SEURING20062006, vol.22, no.3
Security Extension for IEEE Std 1149.1FRANC NOVAK; ANTON BIASIZZO20062006, vol.22, no.3



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