期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2025



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2008, vol.24, no.1-3 2008, vol.24, no.4 2008, vol.24, no.5 2008, vol.24, no.6

题名作者出版年年卷期
Performance-Optimized Design for Parametric ReliabilityRamyanshu Datta; Jacob A. Abraham; Abdulkadir Utku Diril; Abhijit Chatterjee; Kevin J. Nowka20082008, vol.24, no.1-3
Improving Yield and Defect Tolerance in Subthreshold CMOS Through Output-Wired RedundancyKristian Granhaug; Snorre Aunet20082008, vol.24, no.1-3
Design Considerations for High Performance RF Cores Based on Process Variation StudyShambhu Upadhyaya; Nandakumar P. Venugopal; Nihal Shastry; Srinivasan Gopalakrishnan; Bharath V. Kuppuswamy; Rana Bhowmick; Prerna Mayor20082008, vol.24, no.1-3
Hierarchical Verification for Increasing Performance in Reliable ProcessorsJoonhyuk Yoo; Manoj Franklin20082008, vol.24, no.1-3
Checkers' No-Harm Alarms and Design Approaches to Tolerate ThemDaniele Rossi; Martin Omana; Cecilia Metra20082008, vol.24, no.1-3
Analysis and Evaluations of Reliability of Reconfigurable FPGAsSalvatore Pontarelli; Marco Ottavi; Vamsi Vankamamidi; Gian Carlo Cardarilli; Fabrizio Lombardi; Adelio Salsano20082008, vol.24, no.1-3
A New Approach to Single Event Effect Tolerance Based on Asynchronous Circuit TechniqueRui Gong; Wei Chen; Fang Liu; Kui Dai; Zhiying Wang20082008, vol.24, no.1-3
Majority Logic Mapping for Soft Error DependabilityLorenzo Petroli; Carlos Arthur Lang Lisboa; Fernanda Lima Kastensmidt; Luigi Carro20082008, vol.24, no.1-3
Design of Low Power & Reliable Networks on Chip Through Joint Crosstalk Avoidance and Multiple Error Correction CodingAmlan Ganguly; Partha Pratim Pande; Benjamin Belzer; Cristian Grecu20082008, vol.24, no.1-3
Defect Analysis and Defect Tolerant Design of Multi-port SRAMsLushan Liu; Pradeep Nagaraj; Shambhu Upadhyaya; Ramalingam Sridhar20082008, vol.24, no.1-3
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