期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



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2024

2008, vol.24, no.1-3 2008, vol.24, no.4 2008, vol.24, no.5 2008, vol.24, no.6

题名作者出版年年卷期
On Composite Leakage Current MaximizationAshesh Rastogi; Kunal P. Ganeshpure; Alodeep Sanyal; Sandip Kundu20082008, vol.24, no.4
Scan Shift Power Reduction by Freezing Power Sensitive Scan CellsXijiang Lin; Yu Huang20082008, vol.24, no.4
Scan Division Algorithm for Shift and Capture Power Reduction for At-Speed Test Using Skewed-Load Test Application StrategyHo Fai Ko; Nicola Nicolici20082008, vol.24, no.4
A New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test EnvironmentHong-Sik Kim; Sungho Kang; Michael S. Hsiao20082008, vol.24, no.4
Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan TestingXiaoqing Wen; Kohei Miyase; Tatsuya Suzuki; Seiji Kajihara; Laung-Terng Wang; Kewal K. Saluja; Kozo Kinoshita20082008, vol.24, no.4
A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power ReductionN. Badereddine; Z. Wang; P. Girard; K. Chakrabarty; A. Virazel; S. Pravossoudovitch; C. Landrault20082008, vol.24, no.4
Scan-in and Scan-out Transition Co-optimization Through Modelling Generalized Serial TransformationsOzgur Sinanoglu20082008, vol.24, no.4



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