期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



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2024

2008, vol.24, no.1-3 2008, vol.24, no.4 2008, vol.24, no.5 2008, vol.24, no.6

题名作者出版年年卷期
Mitigating Soft Errors in SRAM Address Decoders Using Built-in Current SensorsEgas Henes Neto; Gilson Wirth; Fernanda Lima Kastensmidt20082008, vol.24, no.5
Improving the Effectiveness of Combinational Decompressors Through Judicious Partitioning of Scan CellsOzgur Sinanoglu20082008, vol.24, no.5
Comparison of NIST and Wavelet Transform Test Point Selection Methods For a Programmable Gain AmplifierXinsong Zhang; Simon S. Ang; Chandra Carter20082008, vol.24, no.5
Noise-Insensitive Digital BIST for any PLL or DLLStephen Sunter; Aubin Roy20082008, vol.24, no.5
Reverse Breakdown Voltage Measurement for Power P{sup}+NN{sup}+ RectifierGuangyu Huang; Cher Ming Tan20082008, vol.24, no.5
Controllability of Static CMOS Circuits for Timing CharacterizationRamyanshu Datta; Ravi Gupta; Antony Sebastine; Jacob A. Abraham; Manuel d'Abreu20082008, vol.24, no.5
A Reconfigurable Power Conscious Core Wrapper and its Application to System-on-Chip Test SchedulingErik Larsson; Zebo Peng20082008, vol.24, no.5



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