期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2009, vol.25, no.1 2009, vol.25, no.2/3 2009, vol.25, no.4/5 2009, vol.25, no.6

题名作者出版年年卷期
On Built-in Self-Test for AddersMary D. Pulukuri; Charles E. Stroud20092009, vol.25, no.6
On Boosting the Accuracy of Non-RF to RF Correlation-Based Specification Test CompactionNathan Kupp; Petros Drineas; Mustapha Slamani; Yiorgos Makris20092009, vol.25, no.6
A Better Method than Tail-fitting Algorithm for Jitter Separation Based on Gaussian Mixture ModelFangyuan Nan; Yaonan Wang; Fuhai Li; Weifeng Yang; Xiaoping Ma20092009, vol.25, no.6
LPTest: a Flexible Low-Power Test Pattern GeneratorMeng-Fan Wu; Kai-Shun Hu; Jiun-Lang Huang20092009, vol.25, no.6
PSL Assertion Checking Using Temporally Extended High-Level Decision DiagramsMaksim Jenihhin; Jaan Raik; Anton Chepurov; Raimund Ubar20092009, vol.25, no.6
Low-Area Wrapper Cell Design for Hierarchical SoC TestingKyuchull Kim; Kewal K. Saluja20092009, vol.25, no.6
Utilizing On-chip Resources for Testing Embedded Mixed-signal CoresCarsten Wegener; Heinz Mattes; Stephane Kirmser; Frank Demmerle; Sebastian Sattler20092009, vol.25, no.6
A Modified Charge Pumping Method for Measuring Interface States Up to the Ghz RangeR. Fernandez20092009, vol.25, no.4/5
A Reliable Architecture for Parallel Implementations of the Advanced Encryption StandardG. Di Natale; M. Doulcier; M. L. Flottes; B. Rouzeyre20092009, vol.25, no.4/5
Adaptive Debug and Diagnosis Without Fault DictionariesStefan Hoist; Hans-Joachim Wunderlich20092009, vol.25, no.4/5
123



制造业外文文献服务平台