期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2009, vol.25, no.1 2009, vol.25, no.2/3 2009, vol.25, no.4/5 2009, vol.25, no.6

题名作者出版年年卷期
Critical Path Selection for Delay Testing Considering Coupling NoiseRajeshwary Tayade; Jacob A. Abraham20092009, vol.25, no.4/5
Fault Detection Structures of the S-boxes and the Inverse S-boxes for the Advanced Encryption StandardMehran Mozaffari-Kermani; Arash Reyhani-Masoleh20092009, vol.25, no.4/5
X-tolerant Test Data Compaction with Accelerated Shift RegistersMartin Hilscher; Michael Braun; Michael Richter; Andreas Leininger; Michael Gossel20092009, vol.25, no.4/5
Adaptive Debug and Diagnosis Without Fault DictionariesStefan Hoist; Hans-Joachim Wunderlich20092009, vol.25, no.4/5
A Reliable Architecture for Parallel Implementations of the Advanced Encryption StandardG. Di Natale; M. Doulcier; M. L. Flottes; B. Rouzeyre20092009, vol.25, no.4/5
A Modified Charge Pumping Method for Measuring Interface States Up to the Ghz RangeR. Fernandez20092009, vol.25, no.4/5



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