期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2017, vol.33, no.1 2017, vol.33, no.2 2017, vol.33, no.3 2017, vol.33, no.4 2017, vol.33, no.5 2017, vol.33, no.6

题名作者出版年年卷期
A Low-cost Dithering Method for Improving ADC Linearity Test Applied in uSMILE AlgorithmChen, Tao; Chen, Degang; Duan, Yan20172017, vol.33, no.6
Evaluating the Effectiveness of D-chains in SAT-based ATPG and Diagnostic TPGRaiola, Pascal; Burchard, Jan; Neubauer, Felix; Erb, Dominik; Becker, Bernd20172017, vol.33, no.6
A Study of PN Junction Diffusion Capacitance of MOSFET in Presence of Single Event TransientYi, Tengyue; Liu, Yi; Yang, Yintang20172017, vol.33, no.6
A Reliability-Aware Methodology to Isolate Timing-Critical Paths under AgingSrivastava, Ankush; Singh, Virendra; Singh, Adit D.; Saluja, Kewal K.20172017, vol.33, no.6
Study on Magnetic Probe Calibration in Near-field Measurement System for EMI ApplicationTian, Gengxin; Li, Jun; Liu, Xiaofang; Wan, Lixi; Cao, Liqiang20172017, vol.33, no.6
A Low Power Online Test Method for FPGA Single Solder Joint ResistanceMa, Xiaoyu; Wang, Nantian; Xu, Xiaobin; Rui, Ziqiao20172017, vol.33, no.6
EditorialAgrawal, Vishwani D.20172017, vol.33, no.6
A Diagnostics Method for Analog Circuits Based on Improved Kernel Entropy Component AnalysisYuan, Zhijie; He, Yigang; Yuan, Lifen; Cheng, Zhen20172017, vol.33, no.6
A Novel Noise-assisted Prognostic Method for Linear Analog CircuitsYan, Liyue; Wang, Houjun; Liu, Zhen; Zhou, Jingyu; Long, Bing20172017, vol.33, no.5
High Speed Error Tolerant Adder for Multimedia ApplicationsAmritvalli, P.; Geetha, S.20172017, vol.33, no.5
1234567



制造业外文文献服务平台