期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



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2024

2017, vol.33, no.1 2017, vol.33, no.2 2017, vol.33, no.3 2017, vol.33, no.4 2017, vol.33, no.5 2017, vol.33, no.6

题名作者出版年年卷期
EditorialAgrawal, Vishwani D.20172017, vol.33, no.1
Test Technology NewsletterTheocharides, Theo20172017, vol.33, no.1
Test Planning for Core-based Integrated Circuits under Power ConstraintsSenGupta, Breeta; Nikolov, Dimitar; Ingelsson, Urban; Larsson, Erik20172017, vol.33, no.1
A Low-Cost Reliability vs. Cost Trade-Off Methodology to Selectively Harden Logic CircuitsWali, I.; Deveautour, B.; Virazel, Arnaud; Bosio, A.; Girard, P.; Reorda, M. Sonza20172017, vol.33, no.1
Radiation-Induced Fault Simulation of SOI/SOS CMOS LSI's Using Universal Rad-SPICE MOSFET ModelPetrosyants, Konstantin O.; Sambursky, Lev M.; Kharitonov, Igor A.; Lvov, Boris G.20172017, vol.33, no.1
A High-Level Approach to Analyze the Effects of Soft Errors on Lossless Compression AlgorithmsAvramenko, Serhiy; Reorda, Matteo Sonza; Violante, Massimo; Fey, Goerschwin20172017, vol.33, no.1
On the Consolidation of Mixed Criticalities Applications on Multicore ArchitecturesEsposito, Stefano; Violante, Massimo20172017, vol.33, no.1
A HW/SW Cross-Layer Approach for Determining Application-Redundant Hardware Faults in Embedded SystemsBartsch, Christian; Villarraga, Carlos; Stoffel, Dominik; Kunz, Wolfgang20172017, vol.33, no.1
An Efficient Reverse Engineering Hardware Trojan Detector Using Histogram of Oriented GradientsNasr, Abdurrahman A.; Abdulmageed, Mohamed Z.20172017, vol.33, no.1
Golden-Free Hardware Trojan Detection with High Sensitivity Under Process NoiseHoque, Tamzidul; Narasimhan, Seetharam; Wang, Xinmu; Mal-Sarkar, Sanchita; Bhunia, Swarup20172017, vol.33, no.1
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