期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2017, vol.33, no.1 2017, vol.33, no.2 2017, vol.33, no.3 2017, vol.33, no.4 2017, vol.33, no.5 2017, vol.33, no.6

题名作者出版年年卷期
A Systematic Method for Arranging Diagnostic Tests in Linear Analog DC and AC CircuitsTadeusiewicz, Michal; Halgas, Stanislaw20172017, vol.33, no.2
Power-Aware Optimization of SoC Test Schedules Using Voltage and Frequency ScalingSheshadri, Vijay; Agrawal, Vishwani D.; Agrawal, Prathima20172017, vol.33, no.2
Link Testing: a Survey of Current Trends in Network on ChipAghaei, Babak; Khademzadeh, Ahmad; Reshadi, Midia; Badie, Kambiz20172017, vol.33, no.2
A Parallel Test Application Method towards Power ReductionGuo, Yang; Li, Zhentao; Deng, Ding20172017, vol.33, no.2
EditorialAgrawal, Vishwani D.20172017, vol.33, no.2
A Time-Optimized Scheme Towards Analysis of Channel-Shorts in on-Chip NetworksBhowmik, Biswajit; Deka, Jatindra Kumar; Biswas, Santosh20172017, vol.33, no.2
Reliability Model for Multiple-Error Protected Static MemoriesJahanirad, Hadi20172017, vol.33, no.2
A Bridged Contactless Measurement Technique for LC Tank Based Voltage-Controlled OscillatorLiu, Zhe; Yu, Xiao-Peng; Fan, Teng-long; Cao, Cheng; Sui, Wen-Quan20172017, vol.33, no.2
Total Ionizing Dose Effect and Single Event Burnout of VDMOS with Different Inter Layer Dielectric and PassivationMo, Jiongjiong; Chen, Hua; Yu, Faxin; Wang, Liping20172017, vol.33, no.2
VI-Based Measurement System Focusing on Space ApplicationsSeixas, L. E., Jr.; Finco, S.; Gimenez, S. P.20172017, vol.33, no.2



制造业外文文献服务平台