期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



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2024

2017, vol.33, no.1 2017, vol.33, no.2 2017, vol.33, no.3 2017, vol.33, no.4 2017, vol.33, no.5 2017, vol.33, no.6

题名作者出版年年卷期
EditorialAgrawal, Vishwani D.20172017, vol.33, no.4
An Access Mechanism for Embedded Sensors in Modern SoCsHe, Miao (Tony); Tehranipoor, Mark20172017, vol.33, no.4
Hardware Trojan Detection Based on Logical TestingBazzazi, Amin; Shalmani, Mohammad Taghi Manzuri; Hemmatyar, Ali Mohammad Afshin20172017, vol.33, no.4
Grouped Genetic Algorithm Based Optimal Tests Selection for System with Multiple Operation ModesYang, ChengLin; Chen, Fang; Tian, Shulin20172017, vol.33, no.4
An Automatic Functional Coverage for Digital Systems Through a Binary Particle Swarm Optimization Algorithm with a Reinitialization MechanismMartinez-Cruz, Alfonso; Barron-Fernandez, Ricardo; Molina-Lozano, Heron; Ramirez-Salinas, Marco-Antonio; Villa-Vargas, Luis-Alfonso; Cortes-Antonio, Prometeo; Cheng, Kwang-Ting (Tim)20172017, vol.33, no.4
ACM: An Energy-Efficient Accuracy Configurable Multiplier for Error-Resilient ApplicationsGarg, Bharat; Sharma, G. K.20172017, vol.33, no.4
Test of Mechanical Failure for Via Holes and Solder Joints of Complex Interconnect StructureShang, Yuling; Sun, Liyuan; Li, Chunquan; Ma, Jianfeng20172017, vol.33, no.4
A New BIST-based Test Approach with the Fault Location Capability for Communication Channels in Network-on-ChipAghaei, Babak; Khademzadeh, Ahmad; Reshadi, Midia; Badie, Kambiz20172017, vol.33, no.4
Resistive Bridging Defect Detection in Bulk, FDSOI and FinFET TechnologiesKarel, Amit; Comte, Mariane; Galliere, Jean-Marc; Azais, Florence; Renovell, Michel20172017, vol.33, no.4
Built-In Fault Localization Circuitry for High Performance FPGA Based ImplementationsDhar, Anindya Sundar; Palchaudhuri, Ayan20172017, vol.33, no.4
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