期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



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2024

2017, vol.33, no.1 2017, vol.33, no.2 2017, vol.33, no.3 2017, vol.33, no.4 2017, vol.33, no.5 2017, vol.33, no.6

题名作者出版年年卷期
EditorialAgrawal, Vishwani D.20172017, vol.33, no.5
Soft Fault Diagnosis in Analog Circuits Based on Bispectral ModelsDeng, Yong; Liu, Ning20172017, vol.33, no.5
Efficient Techniques for Fault Detection and Correction of Reversible CircuitsBabu, Hafiz Md. Hasan; Mia, Md. Solaiman; Biswas, Ashis Kumer20172017, vol.33, no.5
Three-Stage Optimization of Pre-Bond Diagnosis of TSV DefectsZhang, Bei; Agrawal, Vishwani D.20172017, vol.33, no.5
Formal Methods Based Synthesis of Single Event Transient Tolerant Combinational CircuitsHamad, Ghaith Bany; Mohamed, Otmane Ait; Savaria, Yvon20172017, vol.33, no.5
Offline Error Detection in MEDA-Based Digital Microfluidic Biochips Using Oscillation-Based Testing MethodologyShukla, Vineeta; Hussin, Fawnizu Azmadi; Hamid, Nor Hisham; Ali, Noohul Basheer Zain; Chakrabarty, Krishnendu20172017, vol.33, no.5
Analysing NBTI Impact on SRAMs with Resistive DefectsMartins, M. T.; Medeiros, G. C.; Copetti, T.; Vargas, F. L.; Bolzani Poehls, L. M.20172017, vol.33, no.5
New Light Weight Threshold Voltage Defined Camouflaged Gates for Trustworthy DesignsRathor, Vijaypal Singh; Garg, Bharat; Sharma, G. K.20172017, vol.33, no.5
Novel Method for Nondestructive Body Effect Measurement in Dynamic Random Access MemoryJung, Ilwoo; Sung, Bonggu; Choi, Byoungdeog20172017, vol.33, no.5
High Speed Error Tolerant Adder for Multimedia ApplicationsAmritvalli, P.; Geetha, S.20172017, vol.33, no.5
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