期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



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2024

2017, vol.33, no.1 2017, vol.33, no.2 2017, vol.33, no.3 2017, vol.33, no.4 2017, vol.33, no.5 2017, vol.33, no.6

题名作者出版年年卷期
A Diagnostics Method for Analog Circuits Based on Improved Kernel Entropy Component AnalysisYuan, Zhijie; He, Yigang; Yuan, Lifen; Cheng, Zhen20172017, vol.33, no.6
EditorialAgrawal, Vishwani D.20172017, vol.33, no.6
A Low Power Online Test Method for FPGA Single Solder Joint ResistanceMa, Xiaoyu; Wang, Nantian; Xu, Xiaobin; Rui, Ziqiao20172017, vol.33, no.6
Study on Magnetic Probe Calibration in Near-field Measurement System for EMI ApplicationTian, Gengxin; Li, Jun; Liu, Xiaofang; Wan, Lixi; Cao, Liqiang20172017, vol.33, no.6
A Reliability-Aware Methodology to Isolate Timing-Critical Paths under AgingSrivastava, Ankush; Singh, Virendra; Singh, Adit D.; Saluja, Kewal K.20172017, vol.33, no.6
A Study of PN Junction Diffusion Capacitance of MOSFET in Presence of Single Event TransientYi, Tengyue; Liu, Yi; Yang, Yintang20172017, vol.33, no.6
Evaluating the Effectiveness of D-chains in SAT-based ATPG and Diagnostic TPGRaiola, Pascal; Burchard, Jan; Neubauer, Felix; Erb, Dominik; Becker, Bernd20172017, vol.33, no.6
A Low-cost Dithering Method for Improving ADC Linearity Test Applied in uSMILE AlgorithmChen, Tao; Chen, Degang; Duan, Yan20172017, vol.33, no.6



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