期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



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2024

2019, vol.35, no.1 2019, vol.35, no.2 2019, vol.35, no.3 2019, vol.35, no.4 2019, vol.35, no.5 2019, vol.35, no.6

题名作者出版年年卷期
Fault Tolerant Soft-Core Processor Architecture Based on Temporal RedundancyVilla, Paulo R. C.; Travessini, Rodrigo; Goerl, Roger C.; Bezerra, Eduardo A.; Vargas, Fabian L.20192019, vol.35, no.1
Impact of Negative Bias Temperature Instability on Gate-All-Around Flip-FlopsTaghipour, Shiva; Asli, Rahebeh Niaraki20192019, vol.35, no.1
An Optimized NS2 Module for UHF Passive RFID SystemsBenfraj, Rahma; Beroulle, Vincent; Fourty, Nicolas; Meddeb, Aref20192019, vol.35, no.1
EditorialAgrawal, Vishwani D.20192019, vol.35, no.1
A Layout-Based Rad-Hard DICE Flip-Flop DesignWang, Haibin; Dai, Xixi; Ibrahim, Younis Mohammed Younis; Sun, Hongwen; Nofal, Issam; Cai, Li; Guo, Gang; Shen, Zicai; Chen, Li20192019, vol.35, no.1
An Efficient Metric-Guided Gate Sizing Methodology for Guardband Reduction Under Process Variations and Aging EffectsGomez, Andres; Champac, Victor20192019, vol.35, no.1
Design of Two-Tone RF Generator for On-Chip IP3/IP2 TestAhmad, Shakeel; Dabrowski, Jerzy20192019, vol.35, no.1
Analytical Models for the Evaluation of Resistive Short Defect Detectability in Presence of Process Variations: Application to 28nm Bulk and FDSOI TechnologiesKarel, Amit; Azais, Florence; Comte, Mariane; Renovell, Michel; Galliere, Jean-Marc20192019, vol.35, no.1
Metric-Driven Verification Methodology with Regression ManagementCieplucha, Marek20192019, vol.35, no.1
RTOS Solution for NoC-Based COTS MPSoC Usage in Mixed-Criticality SystemsAvramenko, Serhiy; Violante, Massimo20192019, vol.35, no.1



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