期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



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2024

2019, vol.35, no.1 2019, vol.35, no.2 2019, vol.35, no.3 2019, vol.35, no.4 2019, vol.35, no.5 2019, vol.35, no.6

题名作者出版年年卷期
Characterization Method for Integrated Magnetic Devices at Lower Frequencies (up to 110MHz)Oumar, D. A.; Boukhari, M. I.; Taha, M. A.; Capraro, S.; Pietroy, D.; Chatelon, J. P.; Rousseau, J. J.20192019, vol.35, no.2
Single Event Transient Propagation Probabilities Analysis for Nanometer CMOS CircuitsHe, Binyong; Yu, Fei; Cai, Shuo; Wang, Weizheng20192019, vol.35, no.2
Impact of Bias Temperature Instability (BTI) Aging Phenomenon on Clock Deskew BuffersGrossi, Marco; Omana, Martin20192019, vol.35, no.2
Testing of Current Carrying Capacity of Conducting Tracks in High Power Flexible Printed Circuit BoardsKumar, Remesh K. R.; Kumar, K. Shreekrishna20192019, vol.35, no.2
Evaluating the Impact of Temperature on Dynamic Fault Behaviour of FinFET-Based SRAMs with Resistive DefectsCardoso Medeiros, G.; Brum, E.; Bolzani Poehls, L.; Copetti, T.; Balen, T.20192019, vol.35, no.2
Memory-Aware Design Space Exploration for Reliability Evaluation in Computing SystemsKooli, Maha; Di Natale, Giorgio; Bosio, Alberto20192019, vol.35, no.2
A Unified Approach to Detect and Distinguish Hardware Trojans and Faults in SRAM-based FPGAsPooyan, Fatemeh; Asadi, Hossein; Ranjbar, Omid; Bayat-Sarmadi, Siavash20192019, vol.35, no.2
Low-Cost Strategy for Bus Propagation Delay ReductionOmana, M.; Govindaraj, S.; Metra, C.20192019, vol.35, no.2
A Low-Cost Test Solution for Reliable Communication in Networks-on-ChipBhowmik, Biswajit; Biswas, Santosh; Deka, Jatindra Kumar; Bhattacharya, Bhargab B.20192019, vol.35, no.2
An Integrated on-Silicon Verification Method for FPGA OverlaysKourfali, Alexandra; Fricke, Florian; Huebner, Michael; Stroobandt, Dirk20192019, vol.35, no.2
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