期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



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2024

2019, vol.35, no.1 2019, vol.35, no.2 2019, vol.35, no.3 2019, vol.35, no.4 2019, vol.35, no.5 2019, vol.35, no.6

题名作者出版年年卷期
Contact-Less Near-Field Test of Active Integrated RF Phased Array AntennasShafiee, Maryam; Ozev, Sule20192019, vol.35, no.3
Testing Signals for Electronics: Criteria for SynthesisKhaustov, D. Ye.; Ryzhov, Ye.; Sakovych, L.; Nastishin, Yu. A.; Herasimov, S.; Pavlii, V.; Tymoshchuk, O.; Yakovlev, M. Yu.20192019, vol.35, no.3
Evaluation of the Impact of Technology Scaling on Delay Testing for Low-Cost AVSZandrahimi, Mahroo; Castillejo, Armand; Al-Ars, Zaid; Debaud, Philippe20192019, vol.35, no.3
Low Delay 3-Bit Burst Error Correction CodesLi, Jiaqiang; Reviriego, Pedro; Xiao, Liyi20192019, vol.35, no.3
Saleh Model and Digital Predistortion for Power Amplifiers in Wireless Communications Using the Third-Order Intercept PointAl-kanan, Haider; Yang, Xianzhen; Li, Fu20192019, vol.35, no.3
EditorialAgrawal, Vishwani D.20192019, vol.35, no.3
Assessing the Reliability of Successive Approximate Computing Algorithms under Fault InjectionRodrigues, Gennaro S.; de Oliveira, Adria Barros; Kastensmidt, Fernanda Lima; Pouget, Vincent; Bosio, Alberto20192019, vol.35, no.3
Design of High Speed Error Tolerant Adder Using Gate Diffusion Input TechniqueGeetha, S.; Amritvalli, P.20192019, vol.35, no.3
Modeling Soft Error Propagation in Near-Threshold Combinational Circuits Using Neural NetworksHajian, Ali; Safari, Saeed20192019, vol.35, no.3
A Distributed Error and Anomaly Communication Architecture for Analog and Mixed-Signal SystemsKundu, Rahul; Su, Fei; Goteti, Prashant20192019, vol.35, no.3
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