期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



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2024

2019, vol.35, no.1 2019, vol.35, no.2 2019, vol.35, no.3 2019, vol.35, no.4 2019, vol.35, no.5 2019, vol.35, no.6

题名作者出版年年卷期
Repeated Testing Applications for Improving the IC Test Quality to Achieve Zero Defect Product RequirementsYeh, Chung-Huang; Chen, Jwu E.20192019, vol.35, no.4
An Efficient Wavelet Based Transient Current Test towards Detection of Data Retention Faults in SRAMP, Princy; Sivamangai, N. M.20192019, vol.35, no.4
Test Generation for Bridging Faults in Reversible Circuits Using Path-Level ExpressionsHandique, Mousum; Biswas, Santosh; Deka, Jantindra Kumar20192019, vol.35, no.4
Security Analysis and Improvement of the Pseudo-random Number Generator Based on Piecewise Logistic MapLambic, Dragan20192019, vol.35, no.4
Electromagnetic Parameters Measurement of Sheet Using Separate Microstrip LineZhang, Yunpeng; Li, En; Zheng, Hu20192019, vol.35, no.4
Test Flow Selection for Stacked Integrated CircuitsSenGupta, Breeta; Nikolov, Dimitar; Larsson, Erik; Dash, Assmitra20192019, vol.35, no.4
Enhanced Authentication Using Hybrid PUF with FSM for Protecting IPs of SoC FPGAsKokila, J.; Ramasubramanian, N.20192019, vol.35, no.4
16-Layer PCB Channel Design with Minimum Crosstalk and Optimization of VIA and TDR AnalysisKavitha, A.; Kaitepalli, Ch. Sekhararao; Swaminathan, J. N.; Ahemedali, Shaik20192019, vol.35, no.4
Hardware Trojan Detection Leveraging a Novel Golden Layout Model Towards Practical ApplicationsLiu, Yanjiang; He, Jiaji; Ma, Haocheng; Zhao, Yiqiang20192019, vol.35, no.4
EditorialAgrawal, Vishwani D.20192019, vol.35, no.4
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