期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



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2024

2019, vol.35, no.1 2019, vol.35, no.2 2019, vol.35, no.3 2019, vol.35, no.4 2019, vol.35, no.5 2019, vol.35, no.6

题名作者出版年年卷期
Fault Localization and Testability Approaches for FPGA Fabric Aware Canonic Signed Digit Recoding ImplementationsPalchaudhuri, Ayan; Dhar, Anindya Sundar20192019, vol.35, no.6
DVFS Based Error Avoidance Strategy in Wireless Network-on-ChipOuyang, Yiming; Wang, Qi; Hu, Lizhu; Liang, Huaguo20192019, vol.35, no.6
Leveraging Balanced Logic Gates as Strong PUFs for Securing IoT Against Malicious AttacksYu, Weize; Wen, Yiming20192019, vol.35, no.6
Noise and Spur Comparison of Delta-Sigma Modulators in Fractional-N PLLsZhou, Bo; Li, Yao; Zhao, Fuyuan20192019, vol.35, no.6
Multi-PVT-Point Analysis and Comparison of Recent Small-Delay Defect Quality MetricsSavaria, Yvon; Thibeault, Claude; Hasib, Omar Al-Terkawi20192019, vol.35, no.6
Repurposing FPGAs for Tester Design to Enhance Field-Testing in a 3D StackSun, Yi; Zhang, Fanchen; Jiang, Hui; Nepal, Kundan; Dworak, Jennifer; Manikas, Theodore; Bahar, R. Iris20192019, vol.35, no.6
Multi-Step-Ahead Prediction for a CMOS Low Noise Amplifier Aging Due to NBTI and HCI Using Neural NetworksYang, Chuang; Feng, Feng20192019, vol.35, no.6
Efficient Built-In Test and Calibration of High Speed Serial I/O Systems Using Monobit Signal AcquisitionMoon, Thomas; Choi, Hyun Woo; Keezer, David C.; Chatterjee, Abhijit20192019, vol.35, no.6
Comparing Graph-Based Algorithms to Generate Test Cases from Finite State MachinesMariano, Matheus Monteiro; de Souza, Erica Ferreira; Endo, Andre Takeshi; Vijaykumar, Nandamudi Lankalapalli20192019, vol.35, no.6
An Efficient Technique to Detect Stealthy Hardware Trojans Independent of the Trigger SizeSebt, S. M.; Patooghy, A.; Beitollahi, H.20192019, vol.35, no.6
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