期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



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2012 2013 2014 2015 2016 2017
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2024

2024, vol.40, no.1 2024, vol.40, no.2

题名作者出版年年卷期
Radiation Hardened by Design-based Voltage Controlled Oscillator for Low Power Phase Locked Loop ApplicationPattanaik, Manisha; Srivastava, Pankaj; Ahirwar, Rachana20242024, vol.40, no.2
Comparison of Single Event Effect and Space Electrostatic Discharge Effect on FPGA Signal TransmissionCao, Rongxing; Liu, Yan; Cai, Yulong; Mei, Bo; Zhao, Lin; Tian, Jiayu; Cui, Shuai; Lv, He; Zeng, Xianghua; Xue, Yuxiong20242024, vol.40, no.2
The EditorialAgrawal, Vishwani D.20242024, vol.40, no.2
A DfT Strategy for Guaranteeing ReRAM's Quality after ManufacturingCopetti, T. S.; Fieback, M.; Gemmeke, T.; Poehls, L. M. Bolzani; Hamdioui, S.20242024, vol.40, no.2
A Survey and Recent Advances: Machine Intelligence in Electronic TestingRoy, Soham; Millican, Spencer K.; Agrawal, Vishwani D.20242024, vol.40, no.2
Instant Test and Repair for TSVs using Differential SignalingWen, Ching-Yi; Huang, Shi-Yu20242024, vol.40, no.2
An Analytical Model for Deposited Charge of Single Event Transient (SET) in FinFETLiu, Baojun; Cai, Li; Li, Chuang20242024, vol.40, no.2
Syntactic and Semantic Analysis of Temporal Assertions to Support the Approximation of RTL DesignsBosio, Alberto; Germiniani, Samuele; Pravadelli, Graziano; Traiola, Marcello20242024, vol.40, no.2
Simulation-based Analysis of RPL Routing Attacks and Their Impact on IoT Network PerformanceBokka, Raveendranadh; Sadasivam, Tamilselvan20242024, vol.40, no.2
Sahand: A Software Fault-Prediction Method Using Autoencoder Neural Network and K-Means AlgorithmArasteh, Bahman; Golshan, Sahar; Shami, Shiva; Kiani, Farzad20242024, vol.40, no.2
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