期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2025



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2024 2025

2024, vol.40, no.1 2024, vol.40, no.2 2024, vol.40, no.3 2024, vol.40, no.4 2024, vol.40, no.5 2024, vol.40, no.6

题名作者出版年年卷期
The EditorialAgrawal, Vishwani D.Agrawal, Vishwani D.20242024, vol.40, no.6
A SLvT Adaptive Test Method for Integrated Circuit Test Parameter Sets without Yield LossWu, Qiong; Hao, Kaiming; Zhan, WenfaWu, Qiong; Hao, Kaiming; Zhan, Wenfa20242024, vol.40, no.6
A Feature-Adaptive and Scalable Hardware Trojan Detection Framework For Third-party IPs Utilizing Multilevel Feature Analysis and Random ForestLiu, Yanjiang; Li, Junwei; Guo, Pengfei; Zhu, Chunsheng; Wang, Junjie; Zhong, Jingxin; Zhang, LichaoLiu, Yanjiang; Li, Junwei; Guo, Pengfei; Zhu, Chunsheng; Wang, Junjie; Zhong, Jingxin; Zhang, Lichao20242024, vol.40, no.6
Modeling and Parasitic Extraction of the MM9 Transistor for GHz/THz CMOS RF Circuit DesignGadige, Aswini Kumar; ParameshaGadige, Aswini Kumar; Paramesha20242024, vol.40, no.6
A Novel Two-Stage Model Based SCA against secAESWu, XiaoNian; Li, JinLin; Zhang, RunLian; Zhang, HaiLongWu, XiaoNian; Li, JinLin; Zhang, RunLian; Zhang, HaiLong20242024, vol.40, no.6
Multi-modal Pre-silicon Evaluation of Hardware Masking StylesAnik, Md Toufiq Hasan; Reefat, Hasin Ishraq; Cheng, Wei; Danger, Jean-Luc; Guilley, Sylvain; Karimi, NaghmehAnik, Md Toufiq Hasan; Reefat, Hasin Ishraq; Cheng, Wei; Danger, Jean-Luc; Guilley, Sylvain; Karimi, Naghmeh20242024, vol.40, no.6
Fatigue Life Based Study of Electronic Package Mounting Locations on Printed Circuit Boards Subjected to Random Vibration LoadsMuthuram, N.; Saravanan, S.Muthuram, N.; Saravanan, S.20242024, vol.40, no.6
Advancing Low Power BIST Architecture with GAN-Driven Test Pattern OptimizationThangam, C.; Manjith, R.Thangam, C.; Manjith, R.20242024, vol.40, no.6
Efficient Selective Image Fusion: A PCB Diagnosis Approach and ImplementationWu, Xueqin; Chen, Yikai; Wang, Zekai; Tian, Chenming; Shen, ZhonghuaWu, Xueqin; Chen, Yikai; Wang, Zekai; Tian, Chenming; Shen, Zhonghua20242024, vol.40, no.5
The EditorialAgrawal, Vishwani D.Agrawal, Vishwani D.20242024, vol.40, no.5
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