期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2024, vol.40, no.1 2024, vol.40, no.2

题名作者出版年年卷期
Investigating and Reducing the Architectural Impact of Transient Faults in Special Function Units for GPUsRodriguez Condia, Josie E.; Guerrero-Balaguera, Juan-David; Patino Nunez, Edwar J.; Limas, Robert; Sonza Reorda, Matteo20242024, vol.40, no.2
Sahand: A Software Fault-Prediction Method Using Autoencoder Neural Network and K-Means AlgorithmArasteh, Bahman; Golshan, Sahar; Shami, Shiva; Kiani, Farzad20242024, vol.40, no.2
Simulation-based Analysis of RPL Routing Attacks and Their Impact on IoT Network PerformanceBokka, Raveendranadh; Sadasivam, Tamilselvan20242024, vol.40, no.2
Syntactic and Semantic Analysis of Temporal Assertions to Support the Approximation of RTL DesignsBosio, Alberto; Germiniani, Samuele; Pravadelli, Graziano; Traiola, Marcello20242024, vol.40, no.2
An Analytical Model for Deposited Charge of Single Event Transient (SET) in FinFETLiu, Baojun; Cai, Li; Li, Chuang20242024, vol.40, no.2
Instant Test and Repair for TSVs using Differential SignalingWen, Ching-Yi; Huang, Shi-Yu20242024, vol.40, no.2
A Survey and Recent Advances: Machine Intelligence in Electronic TestingRoy, Soham; Millican, Spencer K.; Agrawal, Vishwani D.20242024, vol.40, no.2
A DfT Strategy for Guaranteeing ReRAM's Quality after ManufacturingCopetti, T. S.; Fieback, M.; Gemmeke, T.; Poehls, L. M. Bolzani; Hamdioui, S.20242024, vol.40, no.2
The EditorialAgrawal, Vishwani D.20242024, vol.40, no.2
Comparison of Single Event Effect and Space Electrostatic Discharge Effect on FPGA Signal TransmissionCao, Rongxing; Liu, Yan; Cai, Yulong; Mei, Bo; Zhao, Lin; Tian, Jiayu; Cui, Shuai; Lv, He; Zeng, Xianghua; Xue, Yuxiong20242024, vol.40, no.2
12



制造业外文文献服务平台