期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2025



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2024 2025

2024, vol.40, no.1 2024, vol.40, no.2 2024, vol.40, no.3 2024, vol.40, no.4 2024, vol.40, no.5 2024, vol.40, no.6

题名作者出版年年卷期
A Defect Detection Method of Mixed Wafer Map Using Neighborhood Path Filtering Clustering AlgorithmHou, Xingna; Qin, Guanxiang; Lu, Ying; Yi, Mulan; Chen, ShouhongHou, Xingna; Qin, Guanxiang; Lu, Ying; Yi, Mulan; Chen, Shouhong20242024, vol.40, no.4
Pebble Traversal-Based Fault Detection and Advanced Reconfiguration Technique for Digital Microfluidic BiochipsSaha, Basudev; Das, Bidyut; Shukla, Vineeta; Majumder, MuktaSaha, Basudev; Das, Bidyut; Shukla, Vineeta; Majumder, Mukta20242024, vol.40, no.4
Investigation of Silicon Aging Effects in Dopingless PUF for Reliable Security SolutionPanchore, Meena; Rajan, Chithraja; Singh, JawarPanchore, Meena; Rajan, Chithraja; Singh, Jawar20242024, vol.40, no.4
Verification and Validation with Prototype Chip Implemented with Layout Level Scan C-ElementsIwata, Hiroshi; Yamasaki, Kokoro; Yamaguchi, Ken'ichiIwata, Hiroshi; Yamasaki, Kokoro; Yamaguchi, Ken'ichi20242024, vol.40, no.4
Dynamic Smartcard Protection and SSELUR-GRU-Based Attack Stage Identification in Industrial IoTMouleeswaran, S. K.; Ramesh, K.; Manikandan, K.; Anbalagan, VivekyoganandMouleeswaran, S. K.; Ramesh, K.; Manikandan, K.; Anbalagan, Vivekyoganand20242024, vol.40, no.4
Interleaved Counter Matrix Code in SRAM Memories for Continuous Adjacent Multiple Bit Upset CorrectionAhilan, A.; Gorantla, Anusha; Kiruba, Gladys; Hamad, Asmaa A.; Hassan, Mohamed M.; Venkatram, N.; Sindhu, T. V.Ahilan, A.; Gorantla, Anusha; Kiruba, Gladys; Hamad, Asmaa A.; Hassan, Mohamed M.; Venkatram, N.; Sindhu, T. V.20242024, vol.40, no.4
High-Dimensional Feature Fault Diagnosis Method Based on HEFS-LGBMLi, Gen; Li, Wenhai; Wen, Tianzhu; Sun, Weichao; Tang, XiLi, Gen; Li, Wenhai; Wen, Tianzhu; Sun, Weichao; Tang, Xi20242024, vol.40, no.4
An Automatic Software Testing Method to Discover Hard-to-Detect Faults Using Hybrid Olympiad Optimization AlgorithmZheng, Leiqing; Arasteh, Bahman; Mehrabani, Mahsa Nazeri; Abania, Amir VahideZheng, Leiqing; Arasteh, Bahman; Mehrabani, Mahsa Nazeri; Abania, Amir Vahide20242024, vol.40, no.4
Predicting Energy Dissipation in QCA-Based Layered-T Gates Under Cell Defects and Polarisation: A Study with Machine-Learning ModelsDhar, Manali; Mukherjee, Chiradeep; Banerjee, Ananya; Manna, Debasmita; Panda, Saradindu; Maji, BansibadanDhar, Manali; Mukherjee, Chiradeep; Banerjee, Ananya; Manna, Debasmita; Panda, Saradindu; Maji, Bansibadan20242024, vol.40, no.4
ADC Dynamic Parameter Testing Scheme Under Relaxed ConditionsYuan, Jun; Zhang, Yuyang; Zhang, Liangrui; Hou, Shuaiqi; Han, YukunYuan, Jun; Zhang, Yuyang; Zhang, Liangrui; Hou, Shuaiqi; Han, Yukun20242024, vol.40, no.4
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