期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2025



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2024 2025

2025, vol.41, no.1

题名作者出版年年卷期
Fault-Aware Test Case Prioritization in Software Testing Using Jaya Archimedes Optimization AlgorithmSugave, Shounak Rushikesh; Kulkarni, Yogesh R.; Jagdale, Balaso; Gutte, VitthalSugave, Shounak Rushikesh; Kulkarni, Yogesh R.; Jagdale, Balaso; Gutte, Vitthal20252025, vol.41, no.1
Design of a Low Noise Amplifier Based on Novel Monolayer Graphene FETKumawat, Arjun Lal; Pandey, Anukul; Raghava, N. S.Kumawat, Arjun Lal; Pandey, Anukul; Raghava, N. S.20252025, vol.41, no.1
Design and Simulation of a Dependable Architecture Using Triple Modular Redundancy for Embedded Cyber-Physical SystemsMahmood, Hamed A.; Khairullah, Shawkat S.Mahmood, Hamed A.; Khairullah, Shawkat S.20252025, vol.41, no.1
Read & Write Stability of CNTFET 6T SRAM Cell: A Comprehensive AnalysisSharma, Vipin Kumar; Kumar, AbhishekSharma, Vipin Kumar; Kumar, Abhishek20252025, vol.41, no.1
Inherent Hardware Identifiers: Advancing IC Traceability and Provenance in the Multi-Die EraKhan, M. Shafkat M.; Xi, Chengjie; Varshney, Nitin; Bahk, Je-Hyeong; Asadizanjani, NavidKhan, M. Shafkat M.; Xi, Chengjie; Varshney, Nitin; Bahk, Je-Hyeong; Asadizanjani, Navid20252025, vol.41, no.1
SEU Fault Injection Strategy for SRAM-based FPGA User Memory Based on Dual-Circuit ModelLiu, Yuchao; Yao, Liang; Zhang, Wenjing; Wang, Yuhao; Jiang, Xinkai; Li, Fusen; Xu, QiuLiu, Yuchao; Yao, Liang; Zhang, Wenjing; Wang, Yuhao; Jiang, Xinkai; Li, Fusen; Xu, Qiu20252025, vol.41, no.1
Quantity Analysis Method for Text-Based Chip Test Datasets from Automated Test EquipmentFu, Jie; Sun, Kai; Jia, Hanbo; Fu, Da; Xu, Jingyuan; Guo, XuanFu, Jie; Sun, Kai; Jia, Hanbo; Fu, Da; Xu, Jingyuan; Guo, Xuan20252025, vol.41, no.1
2024 Reviewers 20252025, vol.41, no.1
The EditorialAgrawal, Vishwani D.Agrawal, Vishwani D.20252025, vol.41, no.1



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