期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



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2024

2015, vol.31, no.1 2015, vol.31, no.2 2015, vol.31, no.3 2015, vol.31, no.4 2015, vol.31, no.5/6

题名作者出版年年卷期
UntitledAgrawal, Vishwani D.20152015, vol.31, no.1
A Power Efficient BIST TPG Method on Don't Care Bit Based 2-D Adjusting and Hamming Distance Based 2-D ReorderingYuan, Haiying; Guo, Kun; Sun, Xun; Mei, Jiaping; Song, Hongying20152015, vol.31, no.1
Pseudo Functional Path Delay Test through Embedded MemoriesGao, Yukun; Zhang, Tengteng; Pokharel, Punj; Chakraborty, Swati; Walker, D. M. H.20152015, vol.31, no.1
Analog Circuit Fault Diagnosis via Sensitivity ComputationYu, Wenxin; He, Yigang20152015, vol.31, no.1
Pattern Generation for Understanding Timing Sensitivity to Power Supply NoiseGao, Yukun; Walker, D. M. H.; Zhang, Tengteng20152015, vol.31, no.1
On-Wafer Calibration Technique for High Frequency Measurement with Simultaneous Voltage and Current TuningRahman, B. M. Farid; Pengpeng, Yujia; Wang, Tengxing; Xia, Tian; Wang, Guoan20152015, vol.31, no.1
Improving Semiconductor Reliability with Advanced Engineering Methods in Test Program DevelopmentVock, Stefan; Escalona, Omar; Turner, Colin20152015, vol.31, no.1
Low Cost Sparse Multiband Signal Characterization Using Asynchronous Multi-Rate Sampling: Algorithms and HardwareTzou, Nicholas; Bhatta, Debesh; Muldrey, Barry J., Jr.; Moon, Thomas; Wang, Xian; Choi, Hyun; Chatterjee, Abhijit20152015, vol.31, no.1
Harzard-Based ATPG for Improving Delay Test QualityLiu, Tieqiao; Zhou, Yingbo; Liu, Yi; Cai, Shuo20152015, vol.31, no.1
Detecting Hardware Trojans using On-chip Sensors in an ASIC DesignKelly, Shane; Zhang, Xuehui; Tehranipoor, Mohammed; Ferraiuolo, Andrew20152015, vol.31, no.1
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