期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



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2024

2015, vol.31, no.1 2015, vol.31, no.2 2015, vol.31, no.3 2015, vol.31, no.4 2015, vol.31, no.5/6

题名作者出版年年卷期
UntitledAgrawal, Vishwani D.20152015, vol.31, no.3
Circuit-Level Simulation of the Single Event Transients in an On-Chip Single Event Latchup Protection SwitchAndjelkovic, Marko S.; Petrovic, Vladimir; Stamenkovic, Zoran; Ristic, Goran S.; Jovanovic, Goran S.20152015, vol.31, no.3
Contactless Testing of Circuit InterconnectsRenbi, Abdelghani; Delsing, Jerker20152015, vol.31, no.3
A Unified Sequential Equivalence Checking Methodology to Verify RTL Designs with High-Level Functional and Protocol Specification ModelsCastro Marquez, Carlos Ivan; Strum, Marius; Chau, Wang Jiang20152015, vol.31, no.3
A Hilbert-Transform-Based Method to Estimate and Correct Timing Error in Time-Interleaved ADCsWang, Li; Guo, Lianping; Jiang, Jun; Qiu, Duyu20152015, vol.31, no.3
Distributed Scan Like Fault Detection and Test Optimization for Digital Microfluidic BiochipsMukherjee, Subhamita; Samanta, Tuhina20152015, vol.31, no.3
A New Approach to Model the Effect of Topology on Testing Using Boundary ScanFotovatikhah, Farnaz; Naraghi, Bahareh; Tavakoli, Fatemeh; Ghadiry, Mahdiar20152015, vol.31, no.3
One More Class of Sequential Circuits having Combinational Test Generation ComplexityDas, Debesh Kumar; Fujiwara, Hideo20152015, vol.31, no.3
A New On-chip Signal Generator for Charge-Based Capacitance Measurement CircuitYu, Xiao Peng; Tian, Rong Qian; Xu, Wen Lin; Shi, Zheng20152015, vol.31, no.3
UntitledAgrawal, Vishwani D.20152015, vol.31, no.3
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