期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



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2024

2015, vol.31, no.1 2015, vol.31, no.2 2015, vol.31, no.3 2015, vol.31, no.4 2015, vol.31, no.5/6

题名作者出版年年卷期
UntitledAgrawal, Vishwani D.20152015, vol.31, no.4
Application of Contactless Testing to PCBs with BGAs and Open SocketsRenbi, Abdelghani; Delsing, Jerker20152015, vol.31, no.4
A High Performance SEU Tolerant LatchHuang, Zhengfeng; Liang, Huaguo; Hellebrand, Sybille20152015, vol.31, no.4
Parametric Built-In Test for 65nm RF LNA Using Non-Intrusive Variation-Aware SensorsDimakos, Athanasios; Stratigopoulos, Haralampos-G.; Siligaris, Alexandre; Mir, Salvador; De Foucauld, Emeric20152015, vol.31, no.4
A Novel Built-in Current Sensor for N-WELL SET DetectionWang, H. -B.; Liu, R.; Chen, L.; Bi, J. -S.; Li, M. -L.; Li, Y. -Q.20152015, vol.31, no.4
Automated Functional Test Generation for Digital Systems Through a Compact Binary Differential Evolution AlgorithmMartinez Cruz, Alfonso; Barron Fernandez, Ricardo; Molina Lozano, Heron; Ramirez Salinas, Marco Antonio; Villa Vargas, Luis Alfonso20152015, vol.31, no.4
A Maximum Power Algorithm to Find Frequencies for Aperiodic Clock TestingGunasekar, Sindhu; Agrawal, Vishwani D.20152015, vol.31, no.4
Impact of Total Ionizing Dose on Bulk Built-In Current Sensors with Dynamic Storage CellSimionovski, Alexandre; Vaz, Rafael G.; Goncalez, Odair L.; Wirth, Gilson20152015, vol.31, no.4
A Small Chip Area Stochastic Calibration for TDC Using Ring Oscillator (vol 30, pg 653, 2014)Katoh, Kentaroh; Kobayashi, Yutaro; Chujo, Takeshi; Wang, Junshan; Li, Ensi; Li, Congbing; Kobayashi, Haruo20152015, vol.31, no.4



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