期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

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2024

2021, vol.37, no.1 2021, vol.37, no.2 2021, vol.37, no.3 2021, vol.37, no.4 2021, vol.37, no.5/6

题名作者出版年年卷期
TTTC Newsletter 20212021, vol.37, no.5/6
Analysis of Security Vulnerability Levels of In-Vehicle Network Topologies Applying Graph RepresentationsPetho Zsombor; Khan Intiyaz; Torok árpád20212021, vol.37, no.5/6
A Framework for Configurable Joint-Scan Design-for-Test ArchitectureTudu Jaynarayan T.; Ahlawat Satyadev; Shukla Sonali; Singh Virendra20212021, vol.37, no.5/6
On Reducing Test Data Volume for Circular Scan Architecture Using Modified Shuffled Shepherd OptimizationJayabalan Muralidharan; Srinivas E.; Shajin Francis H.; Rajesh P.20212021, vol.37, no.5/6
A Test Generation Method of R-2R Digital-to-Analog Converters Based on Genetic AlgorithmYang Xiaoyan; Yang Chenglin; Wang Houjun20212021, vol.37, no.5/6
Retesting Defective Circuits to Allow Acceptable Faults for Yield EnhancementJena Sisir Kumar; Biswas Santosh; Deka Jatindra Kumar20212021, vol.37, no.5/6
Stress-Aware Periodic Test of InterconnectsSadeghi-Kohan Somayeh; Hellebrand Sybille; Wunderlich Hans-Joachim20212021, vol.37, no.5/6
Parameterizable Real Number Models for Mixed-Signal Designs Using SystemVerilogGeorgoulopoulos Nikolaos; Hatzopoulos Alkiviadis20212021, vol.37, no.5/6
2020 JETTA-TTTC Best Paper Award 20212021, vol.37, no.5/6
EditorialAgrawal Vishwani D.20212021, vol.37, no.5/6
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