期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



全部

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2021, vol.37, no.1 2021, vol.37, no.2 2021, vol.37, no.3 2021, vol.37, no.4 2021, vol.37, no.5/6

题名作者出版年年卷期
A Cascaded Multicasting Architecture for Test Data CompressionTseng, Wang-Dauh20212021, vol.37, no.2
Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF CircuitEl Badawi, H.; Azais, F.; Bernard, S.; Comte, M.; Kerzerho, V.; Lefevre, F.20212021, vol.37, no.2
Method of Implanting Hardware Trojan Based on EHW in Part of CircuitLiu, Lijun; Wang, Tao; Wang, Xiaohan20212021, vol.37, no.2
Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM ProcessorShi, Shuting; Chen, Rui; Liu, Rui; Chen, Mo; Shen, Chen; Li, Xuantian; Tian, Haonan; Chen, Li20212021, vol.37, no.2
A Low-Cost, Robust and Tolerant, Digital Scheme for Post-Bond Testing and Diagnosis of TSVsGerakis, Vasileios; Tsiatouhas, Yiorgos; Hatzopoulos, Alkis20212021, vol.37, no.2
Tolerating Soft Errors with Horizontal-Vertical-Diagonal-N-Queen (HVDNQ) ParitySadi, Muhammad Sheikh; Sumaiya, Sumaiya; Dewan, Mouly; Rahman, Atikur20212021, vol.37, no.2
Radiation Tolerant SRAM Cell Design in 65nm TechnologyWang, JianAn; Wu, Xue; Tian, Haonan; Li, Lixiang; Shi, Shuting; Chen, Li20212021, vol.37, no.2
Reducing Library Characterization Time for Cell-aware Test while Maintaining Test QualityGao, Zhan; Hu, Min-Chun; Malagi, Santosh; Swenton, Joe; Huisken, Jos; Goossens, Kees; Marinissen, Erik Jan20212021, vol.37, no.2
Soft Errors Sensitivity of SRAM Cells in Hold, Write, Read and Half-Selected ConditionsMarques, Cleiton Magano; Meinhardt, Cristina; Butzen, Paulo Francisco20212021, vol.37, no.2
Fault Diagnosis Method of Low Noise Amplifier Based on Support Vector Machine and Hidden Markov ModelSun, Lu; Li, Yang; Du, Han; Nian, Fushun; Liang, Peipei20212021, vol.37, no.2



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