期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2021, vol.37, no.1 2021, vol.37, no.2 2021, vol.37, no.3 2021, vol.37, no.4 2021, vol.37, no.5/6

题名作者出版年年卷期
Single Particle Fault Injection Signal Generation Method Using Gaussian Cloud ModelWang, Mengru; Wang, Jinbo; Wang, Jianmin; Zhou, Shan20212021, vol.37, no.1
Estimating Operational Age of an Integrated CircuitChowdhury, Prattay; Guin, Ujjwal; Singh, Adit D.; Agrawal, Vishwani D.20212021, vol.37, no.1
Testing and Diagnosis of Digital Microfluidic Biochips using Multiple DropletsGhosh, Sourav; Roy, Surajit Kumar; Giri, Chandan20212021, vol.37, no.1
High Resolution Pulse Propagation Driven Trojan Detection in Digital SystemsDeyati, Sabyasachi; Muldrey, Barry J.; Singh, Adit D.; Chatterjee, Abhijit20212021, vol.37, no.1
Fault Diagnosis of Linear Analog Electronic Circuit Based on Natural Response Specification using K-NN AlgorithmPandaram, Karthik; Rathnapriya, S.; Manikandan, V.20212021, vol.37, no.1
On-Line Test of Pin-Constrained Digital Microfluidic Biochips with Connect-5 StructureHuang, Xijun; Xu, Chuanpei; Zhang, Long20212021, vol.37, no.1
Model Transferability from ImageNet to Lithography Hotspot DetectionXiao, Yindong; Huang, Xueqian; Liu, Ke20212021, vol.37, no.1
EditorialAgrawal, Vishwani D.20212021, vol.37, no.1
Pre-Silicon Verification Using Multi-FPGA Platforms: A ReviewFarooq, Umer; Mehrez, Habib20212021, vol.37, no.1
Decoupling Capacitor Estimation and Allocation using Optimization Techniques for Power Supply Noise Reduction in System-on-ChipMitra, Partha; Bhaumik, Jaydeb; Sarkar, Angsuman20212021, vol.37, no.1
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