期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2021, vol.37, no.1 2021, vol.37, no.2 2021, vol.37, no.3 2021, vol.37, no.4 2021, vol.37, no.5/6

题名作者出版年年卷期
A Cascaded Multicasting Architecture for Test Data CompressionTseng, Wang-Dauh20212021, vol.37, no.2
Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF CircuitEl Badawi, H.; Azais, F.; Bernard, S.; Comte, M.; Kerzerho, V.; Lefevre, F.20212021, vol.37, no.2
Method of Implanting Hardware Trojan Based on EHW in Part of CircuitLiu, Lijun; Wang, Tao; Wang, Xiaohan20212021, vol.37, no.2
Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM ProcessorShi, Shuting; Chen, Rui; Liu, Rui; Chen, Mo; Shen, Chen; Li, Xuantian; Tian, Haonan; Chen, Li20212021, vol.37, no.2
A Low-Cost, Robust and Tolerant, Digital Scheme for Post-Bond Testing and Diagnosis of TSVsGerakis, Vasileios; Tsiatouhas, Yiorgos; Hatzopoulos, Alkis20212021, vol.37, no.2
Tolerating Soft Errors with Horizontal-Vertical-Diagonal-N-Queen (HVDNQ) ParitySadi, Muhammad Sheikh; Sumaiya, Sumaiya; Dewan, Mouly; Rahman, Atikur20212021, vol.37, no.2
Radiation Tolerant SRAM Cell Design in 65nm TechnologyWang, JianAn; Wu, Xue; Tian, Haonan; Li, Lixiang; Shi, Shuting; Chen, Li20212021, vol.37, no.2
Reducing Library Characterization Time for Cell-aware Test while Maintaining Test QualityGao, Zhan; Hu, Min-Chun; Malagi, Santosh; Swenton, Joe; Huisken, Jos; Goossens, Kees; Marinissen, Erik Jan20212021, vol.37, no.2
Soft Errors Sensitivity of SRAM Cells in Hold, Write, Read and Half-Selected ConditionsMarques, Cleiton Magano; Meinhardt, Cristina; Butzen, Paulo Francisco20212021, vol.37, no.2
Fault Diagnosis Method of Low Noise Amplifier Based on Support Vector Machine and Hidden Markov ModelSun, Lu; Li, Yang; Du, Han; Nian, Fushun; Liang, Peipei20212021, vol.37, no.2



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