期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2021, vol.37, no.1 2021, vol.37, no.2 2021, vol.37, no.3 2021, vol.37, no.4 2021, vol.37, no.5/6

题名作者出版年年卷期
Reducing Aging Impacts in Digital Sensors via Run-Time CalibrationAnik Md Toufiq Hasan; Ebrahimabadi Mohammad; Danger Jean-Luc; Guilley Sylvain; Karimi Naghmeh20212021, vol.37, no.5/6
Error-Efficient Approximate Multiplier Design using Rounding Based Approach for Image Smoothing ApplicationRao E. Jagadeeswara; Samundiswary P.20212021, vol.37, no.5/6
A Bit-Error Rate Measurement and Error Analysis of Wireline Data Transmission using Current Source Model for Single Event Effect under Irradiation EnvironmentYoshikawa Takefumi; Ishimaru Masahiro; Iwata Tatsuya; Mori Fuma; Kobayashi Kazutoshi20212021, vol.37, no.5/6
EditorialAgrawal Vishwani D.20212021, vol.37, no.5/6
2020 JETTA-TTTC Best Paper Award 20212021, vol.37, no.5/6
Parameterizable Real Number Models for Mixed-Signal Designs Using SystemVerilogGeorgoulopoulos Nikolaos; Hatzopoulos Alkiviadis20212021, vol.37, no.5/6
Stress-Aware Periodic Test of InterconnectsSadeghi-Kohan Somayeh; Hellebrand Sybille; Wunderlich Hans-Joachim20212021, vol.37, no.5/6
Retesting Defective Circuits to Allow Acceptable Faults for Yield EnhancementJena Sisir Kumar; Biswas Santosh; Deka Jatindra Kumar20212021, vol.37, no.5/6
A Test Generation Method of R-2R Digital-to-Analog Converters Based on Genetic AlgorithmYang Xiaoyan; Yang Chenglin; Wang Houjun20212021, vol.37, no.5/6
On Reducing Test Data Volume for Circular Scan Architecture Using Modified Shuffled Shepherd OptimizationJayabalan Muralidharan; Srinivas E.; Shajin Francis H.; Rajesh P.20212021, vol.37, no.5/6
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