期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2025



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024 2025

2000, vol.16, no.1-2 2000, vol.16, no.3 2000, vol.16, no.4 2000, vol.16, no.5 2000, vol.16, no.6

题名作者出版年年卷期
Logic design validation via simulation and automatic test pattern generationHussain Al-Asaad; John P. Hayes20002000, vol.16, no.6
Intermediacy prediction for high speed Berger code checkersCecilia Metra; Jien-Chung Lo20002000, vol.16, no.6
Catastrophic short and open fault detection in bipolar CML circuits: A case studyAndre Ivanov; Vikram Devdas20002000, vol.16, no.6
Bridging faults in pipelined circuitsM. Favalli; C. Metra20002000, vol.16, no.6
A new method for testing Re-programmable PLAsCharles E. Stroud; Jaems R. Bailey; John M. Emmert20002000, vol.16, no.6
A fault tolerant technique for FPAGsJohn M. Emmert; Dinesh K. Bhatia20002000, vol.16, no.6
Testing the local interconnect resources of SRAM-based FPGA'sM. Renovell; J. M. Portal; J. Figueras; Y. Zorian20002000, vol.16, no.5
Testing address decoder faults in two-port memories: fault models, tests, consequences of port restrictions, and test strategySaid Hamdioui; Ad J. Van De Goor20002000, vol.16, no.5
Test cycle count reduction in a parallel scan BIST environmentBechir Ayari; Prab Varma20002000, vol.16, no.5
Static test compaction for scan-based designs to reduce test application timeIrith Pomeranz; Sudhakar M. Reddy20002000, vol.16, no.5
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