期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023

2000, vol.16, no.1-2 2000, vol.16, no.3 2000, vol.16, no.4 2000, vol.16, no.5 2000, vol.16, no.6

题名作者出版年年卷期
Detection of delay faults in memory address decodersEmil Gizdarski20002000, vol.16, no.4
Diagnosis method using ΔI{sub}(DDQ) probabilistic signatures: theory and resultsClaude Thibeault20002000, vol.16, no.4
Distributed BIST architecture to combat delay faultsJacob Savir20002000, vol.16, no.4
Embedded checker architectures for cyclic and low-cost arithmetic codesAlbrecht P. Stroele; Steffen Tarnick20002000, vol.16, no.4
New march tests for multiport RAM devicesKanad Chakraborty; Pinaki Mazumder20002000, vol.16, no.4
Test set and fault partitioning techniques for static test sequence compaction for sequential circuitsMichael S. Hsiao; Srimat Chakradhar20002000, vol.16, no.4
Test set compaction using relaxed subsequence removalMichael S. Hsiao; Srimat Chakradhar20002000, vol.16, no.4



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