期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023

2000, vol.16, no.1-2 2000, vol.16, no.3 2000, vol.16, no.4 2000, vol.16, no.5 2000, vol.16, no.6

题名作者出版年年卷期
A non-scan approach to DFT for controllers achieving 100% fault efficiencySatoshi Ohtake; Toshimitsu Masuzawa; Hideo Fujiwara20002000, vol.16, no.5
A practical vector restoration technique for large sequential circuitsSurendra K. Bommu; Kiran B. Doreswamy; Srimat T. Chakradhar20002000, vol.16, no.5
Algorithms to select IDDQ measurement vectors for bridging faults in sequential circuitsYoshinobu Higami; Yuzo Takamatsu; Kewal K. Saluja; Kozo Kinoshita20002000, vol.16, no.5
BIST TPG for combinational cluster interconnect testing at board levelChen-Huan Chiang; Sandeep K. Gupta20002000, vol.16, no.5
Dynamic power supply current testing of CMOS SRAMsJian Liu; Rafic Z. Makki; Ayman Kayssi20002000, vol.16, no.5
False-path removal using delay fault simulationMarwan A. Gharaybeh; Vishwani D. Agrawal; Michael L. Bushnell; Carlos G. Parodi20002000, vol.16, no.5
I{sub}(DDQ) testing of submicron CMOS--by cooling?M. Rencz; V. Szekely; S. Torok; K. Torki; B. Courtois20002000, vol.16, no.5
LFSR-based deterministic TPG for two-pattern testingXiaowei Li; Paul Y. S. Cheung; Hideo Fujiwara20002000, vol.16, no.5
Reduction of number of paths to be tested in delay testingHuawei Li; Zhongcheng Li; Yinghua Min20002000, vol.16, no.5
Static test compaction for scan-based designs to reduce test application timeIrith Pomeranz; Sudhakar M. Reddy20002000, vol.16, no.5
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