期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2025



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024 2025

2000, vol.16, no.1-2 2000, vol.16, no.3 2000, vol.16, no.4 2000, vol.16, no.5 2000, vol.16, no.6

题名作者出版年年卷期
A biased random instruction generation environment for architectural verification of pipelined processorsTa-Chung Chang; Vikram Iyengar; Elizabeth M. Rudnick20002000, vol.16, no.1-2
A buffer-oriented methodology for microarchitecture validationNoppanunt Utamaphethai; R. D. (Shawn) Blanton; John Paul Shen20002000, vol.16, no.1-2
An efficient logic equivalence checker for industrial circuitsJaehong Park; Carl Pixley; Michael Burns; Hyunwoo Cho;20002000, vol.16, no.1-2
An RTL abstraction technique for processor microarchitecture validation and test generationJian Shen; Jacob A. Abraham20002000, vol.16, no.1-2
Automatic vector generation using constraints and biasingJun Yuan; Kurt Shultz; Carl Pixley; Hillel Miller; Adnan Aziz20002000, vol.16, no.1-2
Formal value-range and variable testability techniques for high-level design-for-testabilitySandhya Seshadri; Michael S. Hsiao20002000, vol.16, no.1-2
On efficiently producing quality tests for custom circuits in PowerPC microprocessorsLi-C. Wang; Magdy S. Abadir20002000, vol.16, no.1-2
Oscillation ring delay test for high performance microprocessorsWen Ching Wu; Chung Len Lee; Ming Shae Wu; Jwu E. Chen; Magdy S. Abadir20002000, vol.16, no.1-2
Testing for function and performance: towards an integrated processor validation methodologyPradip Bose20002000, vol.16, no.1-2
Verification simulation acceleration using code-perturbationByeong Min; Gwan Choi20002000, vol.16, no.1-2



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