期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2000, vol.16, no.1-2 2000, vol.16, no.3 2000, vol.16, no.4 2000, vol.16, no.5 2000, vol.16, no.6

题名作者出版年年卷期
A high-level EDA environment for the automatic insertion of HD-BIST structuresAlfredo Benso; Silvia Cataldo; Silvia Chiusano; Paolo Prinetto20002000, vol.16, no.3
An approach to minimize the test configuration for the logic cells of the XILINX XC4000 FPGAs familyM. Renovell; J. M. Portal; J. Figueras; Y. Zorian20002000, vol.16, no.3
Application of supply current testing to analogue circuits, towards a structural analogue test methodologyH. Manhaeve; J. Verfaillie; B. Straka; J. P. Cornil20002000, vol.16, no.3
Combining functional and structural approaches for switched-current circuit testingM. Renovell; F. Azais; J -C. Bodin; Y. Bertrand20002000, vol.16, no.3
Compaction of IDDQ test sequence using reassignment methodToshiyuki Maeda; Kozo Kinoshita20002000, vol.16, no.3
Debug facilities in the TriMedia CPU64 architectureHarald Vranken20002000, vol.16, no.3
Deterministic BIST with partial scanGundolf Kiefer; Hans-Joachim Wunderlich20002000, vol.16, no.3
Experimental results on BIC sensors for transient current testingR. Picos; M. Roca; E. Isern; J. Segura; E. Garcia-Moreno20002000, vol.16, no.3
Extending fault-based testing to microelectromechanical systemsS. Mir; B. Charlot; B. Courtois20002000, vol.16, no.3
Fast test pattern generation for sequential circuits using decision diagram representationsJaan Raik; Raimund Ubar20002000, vol.16, no.3
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