期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2025



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024 2025

2000, vol.16, no.1-2 2000, vol.16, no.3 2000, vol.16, no.4 2000, vol.16, no.5 2000, vol.16, no.6

题名作者出版年年卷期
A high-level EDA environment for the automatic insertion of HD-BIST structuresAlfredo Benso; Silvia Cataldo; Silvia Chiusano; Paolo Prinetto20002000, vol.16, no.3
An approach to minimize the test configuration for the logic cells of the XILINX XC4000 FPGAs familyM. Renovell; J. M. Portal; J. Figueras; Y. Zorian20002000, vol.16, no.3
Application of supply current testing to analogue circuits, towards a structural analogue test methodologyH. Manhaeve; J. Verfaillie; B. Straka; J. P. Cornil20002000, vol.16, no.3
Combining functional and structural approaches for switched-current circuit testingM. Renovell; F. Azais; J -C. Bodin; Y. Bertrand20002000, vol.16, no.3
Compaction of IDDQ test sequence using reassignment methodToshiyuki Maeda; Kozo Kinoshita20002000, vol.16, no.3
Debug facilities in the TriMedia CPU64 architectureHarald Vranken20002000, vol.16, no.3
Deterministic BIST with partial scanGundolf Kiefer; Hans-Joachim Wunderlich20002000, vol.16, no.3
Experimental results on BIC sensors for transient current testingR. Picos; M. Roca; E. Isern; J. Segura; E. Garcia-Moreno20002000, vol.16, no.3
Extending fault-based testing to microelectromechanical systemsS. Mir; B. Charlot; B. Courtois20002000, vol.16, no.3
Fast test pattern generation for sequential circuits using decision diagram representationsJaan Raik; Raimund Ubar20002000, vol.16, no.3
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