期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2025



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024 2025

2000, vol.16, no.1-2 2000, vol.16, no.3 2000, vol.16, no.4 2000, vol.16, no.5 2000, vol.16, no.6

题名作者出版年年卷期
Detection of delay faults in memory address decodersEmil Gizdarski20002000, vol.16, no.4
Diagnosis method using ΔI{sub}(DDQ) probabilistic signatures: theory and resultsClaude Thibeault20002000, vol.16, no.4
Distributed BIST architecture to combat delay faultsJacob Savir20002000, vol.16, no.4
Embedded checker architectures for cyclic and low-cost arithmetic codesAlbrecht P. Stroele; Steffen Tarnick20002000, vol.16, no.4
New march tests for multiport RAM devicesKanad Chakraborty; Pinaki Mazumder20002000, vol.16, no.4
Test set and fault partitioning techniques for static test sequence compaction for sequential circuitsMichael S. Hsiao; Srimat Chakradhar20002000, vol.16, no.4
Test set compaction using relaxed subsequence removalMichael S. Hsiao; Srimat Chakradhar20002000, vol.16, no.4



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