期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2025



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024 2025

2000, vol.16, no.1-2 2000, vol.16, no.3 2000, vol.16, no.4 2000, vol.16, no.5 2000, vol.16, no.6

题名作者出版年年卷期
A non-scan approach to DFT for controllers achieving 100% fault efficiencySatoshi Ohtake; Toshimitsu Masuzawa; Hideo Fujiwara20002000, vol.16, no.5
A practical vector restoration technique for large sequential circuitsSurendra K. Bommu; Kiran B. Doreswamy; Srimat T. Chakradhar20002000, vol.16, no.5
Algorithms to select IDDQ measurement vectors for bridging faults in sequential circuitsYoshinobu Higami; Yuzo Takamatsu; Kewal K. Saluja; Kozo Kinoshita20002000, vol.16, no.5
BIST TPG for combinational cluster interconnect testing at board levelChen-Huan Chiang; Sandeep K. Gupta20002000, vol.16, no.5
Dynamic power supply current testing of CMOS SRAMsJian Liu; Rafic Z. Makki; Ayman Kayssi20002000, vol.16, no.5
False-path removal using delay fault simulationMarwan A. Gharaybeh; Vishwani D. Agrawal; Michael L. Bushnell; Carlos G. Parodi20002000, vol.16, no.5
I{sub}(DDQ) testing of submicron CMOS--by cooling?M. Rencz; V. Szekely; S. Torok; K. Torki; B. Courtois20002000, vol.16, no.5
LFSR-based deterministic TPG for two-pattern testingXiaowei Li; Paul Y. S. Cheung; Hideo Fujiwara20002000, vol.16, no.5
Reduction of number of paths to be tested in delay testingHuawei Li; Zhongcheng Li; Yinghua Min20002000, vol.16, no.5
Static test compaction for scan-based designs to reduce test application timeIrith Pomeranz; Sudhakar M. Reddy20002000, vol.16, no.5
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