期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2001, vol.17, no.1 2001, vol.17, no.2 2001, vol.17, no.3-4 2001, vol.17, no.5 2001, vol.17, no.6

题名作者出版年年卷期
Test challenges in nanometer technologiesSandip Kundu; Sujit T. Zachariah; Sanjay Sengupta; Rajesh Galivanche20012001, vol.17, no.3-4
Current testing procedure for deep submicron devicesAnton Chichkov; Dirk Merlier; Peter Cox20012001, vol.17, no.3-4
Design for delay testability in high-speed digital ICsH. G. Kerkhoff; H. Speek; M. Shashani; M. Sachdev20012001, vol.17, no.3-4
Delay fault testing: choosing between random SIC and random MIC test sequencesA. Virazel; R. David; P. Girard; C. Landrault; S. Pravossoudovitch20012001, vol.17, no.3-4
On-chip test for mixed-signal ASICs using two-mode comparators with bias-programmable reference voltagesDaniela Venuto; Michael J. Ohletz20012001, vol.17, no.3-4
Optimizing sinusoidal histogram test for low cost ADC BISTF. Azais; S. Bernard; Y. Bertrand; M. Renovell20012001, vol.17, no.3-4
LEAP: an accurate defect-free I{sub}(DDQ) estimatorAntoni Ferre; Joan Figueras20012001, vol.17, no.3-4
Defect detection form visual abnormalities in manufacturing process using I{sub}(DDQ)Masaru Sanada20012001, vol.17, no.3-4
A discussion on test pattern generation for FPGA-implemented circuitsM. Renovell; J. M. Portal; P. Faure; J. Figueras; Y. Zorian20012001, vol.17, no.3-4
Compressed Bit fail maps for memory fail pattern classificationJorg Vollrath; Ulf Lederer; Thomas Hladschik20012001, vol.17, no.3-4
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