期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023

2001, vol.17, no.1 2001, vol.17, no.2 2001, vol.17, no.3-4 2001, vol.17, no.5 2001, vol.17, no.6

题名作者出版年年卷期
SIVA: a system for coverage-directed state space searchMalay Ganai; Praveen Yalagandula; Adnan Aziz; Andreas Kuehlmann; Vigyan Singhal20012001, vol.17, no.1
Fault diagnosis of analog circuits using Bayesian neural networks with wavelet transform as preprocessorFarzan Aminian; Mehran Aminian20012001, vol.17, no.1
Combining GAs and symbolic methods for high quality tests of sequential circuitsMartin Keim; Nicole Drechsler; Rolf Drechsler; Bernd Becker20012001, vol.17, no.1
A unity gain high speed buffer to improve signal integrity in high frequency test interfaceIboun Taimiya Sylla; Mustapha Slamani; Bozena Kaminska20012001, vol.17, no.1
A reliability statistics perspective on the pitfalls of standard wafer-level electromigration accelerated test (SWEAT)Cher Ming Tan; Kelvin Ngan Chong Yeo20012001, vol.17, no.1
Efficient realization of a threshold voter for self-purging redundancyJ. M. Quintana; M. J. Avedillo; J. L. Huertas20012001, vol.17, no.1



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