期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023

2001, vol.17, no.1 2001, vol.17, no.2 2001, vol.17, no.3-4 2001, vol.17, no.5 2001, vol.17, no.6

题名作者出版年年卷期
Detectability conditions opens in the interconnectionsAntonio Zenteno; Victor H. Champac20012001, vol.17, no.2
An effective deterministic BIST scheme for shifter/accumulator pairs in datapathsNektarios Kranitis; Antonis Paschalis; Dimitris Gizopoulos; Mihalis Psarakis; Yervant Zorian20012001, vol.17, no.2
Cost/quality trade-off in synthesis for BISTP. Bukovjan; L. Ducerf-Bourbon; M. Marzouki; V. H. Champac20012001, vol.17, no.2
Fault models and test generation for OpAmp circuits - the FFMJose Vicente Calvano; Antonio Carneiro; Mesquita Filho; Vladimir Castro Alves; Marcelo Soares Lubaszewski20012001, vol.17, no.2
A low-cost BIST architecture for linear histogram testing of ADCsF. Azais; S. Bernard; Y. Bertrand; M. Renovell20012001, vol.17, no.2
Synthesis of an 8051-like micro-controller tolerant to transient faultsErika Cota; Fernanda Lima; Sana Rezgui; Luigi Carro; Raoul Velazco; Marcelo Lubaszewski; Ricardo Reis20012001, vol.17, no.2
Improving reconfigurable systems reliability by combining periodical test and redundancy techniques: a case studyEduardo Augusto Bezerra; Fabian Vargas; Michael Paul Gough20012001, vol.17, no.2
Constraint based criteria: an approach for test case selection in the structural testingSilvia Regina Vergilio; Jose Carlos Maldonado; Mario Jino20012001, vol.17, no.2
An isochronous testing strategy for hierarchical adaptive distributed system-level diagnosisAlessandro Brawerman; Elias Procopio Duarte20012001, vol.17, no.2



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