期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2001, vol.17, no.1 2001, vol.17, no.2 2001, vol.17, no.3-4 2001, vol.17, no.5 2001, vol.17, no.6

题名作者出版年年卷期
New BIST schemes for structural testing of pipelined analog to digital convertersEduardo J. Peralias; Adoracion Rueda; Jose L. Huertas20012001, vol.17, no.5
Digital signature proposal for mixed-signal circuitsAnna Maria Brosa; Joan Figueras20012001, vol.17, no.5
Frequency response verification of analog circuits using global optimization techniquesSuresh Seshadri; Jacob A. Abraham20012001, vol.17, no.5
Process deviations and defects: Two aspects of test and test development for mixed-signal circuitsCarsten Wegener; Michael Peter Kennedy; Bernd Straube20012001, vol.17, no.5
Reducing test time in the high-volume production of analog circuits using efficient test-vector generation and interpolation techniquesMustapha Slamani; Karim Arabi20012001, vol.17, no.5
Fault modeling and fault simulation in mixed micro-fluidic microelectronic systemsHans G. Kerkhoff; Hans P. A. Hendriks20012001, vol.17, no.5
Test and testability of a monolithic MEMS for magnetic field sensingV. Beroulle; Y. Bertrand; L. Latorre; P. Nouet20012001, vol.17, no.5



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