期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2007, vol.23, no.1 2007, vol.23, no.2-3 2007, vol.23, no.4 2007, vol.23, no.5 2007, vol.23, no.6

题名作者出版年年卷期
A System-layer Infrastructure for SoC DiagnosisP. Bernardi; M. Grosso; M. Rebaudengo; M. Sonza Reorda20072007, vol.23, no.5
Securing Scan Control in Crypto ChipsDavid Hely; Frederic Bancel; Marie-Lise Flottes; Bruno Rouzeyre20072007, vol.23, no.5
Too Few or Too Many Properties? Measure it by ATPG!Franco Fummi; Graziano Pravadelli20072007, vol.23, no.5
Functional Constraints vs. Test Compression in Scan-Based Delay TestingIlia Polian; Hideo Fujiwara20072007, vol.23, no.5
Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge CircuitsLuigi Dilillo; Patrick Girard; Serge Pravossoudovitch; Arnaud Virazel; Magali Bastian20072007, vol.23, no.5
Dynamic Fault Diagnosis of Combinational and Sequential Circuits on Reconfigurable HardwareFatih Kocan; Daniel G. Saab20072007, vol.23, no.5
A Novel EDA Tool for VLSI Test Vectors ManagementWalid Ibrahim20072007, vol.23, no.5



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