期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023

2007, vol.23, no.1 2007, vol.23, no.2-3 2007, vol.23, no.4 2007, vol.23, no.5 2007, vol.23, no.6

题名作者出版年年卷期
Estimation of Test Metrics for the Optimisation of Analogue Circuit TestingAhcene Bounceur; Salvador Mir; Emmanuel Simeu; Luis Rolindez20072007, vol.23, no.6
Oscillation Test Scheme of SC Biquad Filters Based on Internal ReconfigurationUros Kac; Franc Novak20072007, vol.23, no.6
Component Value Calculations and Characterizations for Measurements in the IEEE 1149.4 EnvironmentTeuvo Saikkonen; Markku Moilanen20072007, vol.23, no.6
A Design-Based Structural Test Method for a Switched-Resistor DACLei Ma; Geert Seuren; Robert van Rijsinge; Corne Bastiaansen; Leon van der Dussen20072007, vol.23, no.6
Hard-Fault Detection and Diagnosis During the Application of Model-Based Data Converter TestingCarsten Wegener; Michael Peter Kennedy20072007, vol.23, no.6
Oscillator-Based Reconfigurable Sinusoidal Signal Generator for ADC BISTHsin-Wen Ting; Cheng-Wu Lin; Bin-Da Liu; Soon-Jyh Chang20072007, vol.23, no.6
Methods of Testing Discrete Semiconductors in the 1149.4 EnvironmentJari Hannu; Markku Moilanen20072007, vol.23, no.6
Fast PWM-Based Test for High Resolution ∑△ ADCsDaniela De Venuto; Leonardo Reyneri20072007, vol.23, no.6
A Fully-Settled Linear Behavior Plus Noise Model for Evaluating the Digital Stimuli of the Design-for-Digital-Testability ∑-△ ModulatorsHao-Chiao Hong20072007, vol.23, no.6
Reducing Test Time Using an Enhanced RF LoopbackMarcelo Negreiros; Luigi Carro; Altamiro Amadeu Susin20072007, vol.23, no.6
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